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Silicon opitcs- Si ATR prism

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Using the laser absorption spectrum of ATR prism is a fast developing techonoloy of infrared spectrum, and it is also the most widely sampling techinques at present. It can be tested qualitatively or quantitatively, but requires minimal or no sample preparation.This can greatly speed up the testing and improve efficiency , from the multiple reflection ATR to the single reflection ATR, from the normal temperature measurement to measurement of temperature dependence  (maximum temperature up to 300 degrees Celsius), from atmospheric pressure technology to high pressure supercritical technology.For size available or customized size, pls contact with our sales for inquiry.

Technical    Requirement

Commercial Grade

Precision Grade

High Precision

Size range

1-600mm

2-600mm

2-600mm

Dimensional tolerance

土0.1mm

土0.025mm

土0.01mm

Angle tolerance

±3´

±30´´

±5´´

Surface quality

60-40

40-20

20-10

Surface accuracy

1.0λ

λ/10

λ/20

Coating

3-5μm  T >97%

Bevelling

0.1-0.5mm*45°

Substrate

Optical grade silicon

Length(mm)

Width(mm)

Thickness(mm)

Angle

Remark

42

14

2

45

50

20

2

45

52

20

2

45

52

20

2

45

60

12

4

45

68

10

6

45


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